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dc.contributor.advisorSEGURA GOMEZ, HUGO LUIS
dc.contributor.advisorTOLEDO, PEDRO
dc.creatorFLORES RUIZ, MAURICIO
dc.date.accessioned2017-04-25T20:15:23Z
dc.date.available2017-04-25T20:15:23Z
dc.date.issued2003
dc.identifier.urihttp://hdl.handle.net/10533/185174
dc.language.isospa
dc.relationinstname: Conicyt
dc.relationreponame: Repositorio Digital RI2.0
dc.rightsAtribución-NoComenrcial-SinDerivadas 3.0 Chile
dc.titleCalaculo de lineas criticas con eos de origen molecular: modelo saft
dc.typeTesis
dc.contributor.institutionUNIVERSIDAD DE CONCEPCION/FACULTAD DE INGENIERIA/DEPARTAMENTO DE INGENIERIA QUIMICA
dc.identifier.folio1020340
dc.country.isochl
dc.description.conicytprogramFONDECYT
dc.relation.projectidinfo:eu-repo/grantAgreement/Fondecyt/1020340
dc.relation.setinfo:eu-repo/semantics/dataset/hdl.handle.net/10533/93488
dc.rights.driverinfo:eu-repo/semantics/openAccess
dc.description.shortconicytprogramFONDECYT
dc.type.tesisTesis
dc.type.openaireinfo:eu-repo/semantics/publishedVersion


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